• Materials Growth and Characterizations

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    Furnace CVD for growing 2D layer semiconductors

    We have at least 4 systems for growing different materials

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    Confocal Raman spectroscopy

    A high resolution Raman and PL mapping system, equipped with temperature control system

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    UHV thermal deposition for metals

    Deposition of high-quality metals for high-performance devices

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    AFM

    Topographic measurement for nanostructures

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    Optica Microscope

    Examination of microscle features for devices

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    Thermal annealing systems for devices

    Thermal annealing is used to enhance device performance

  • Device Fabrication and Measurements

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    SEM/ EBL for imaging and patterning

    Patterning of nanoscale devices

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    Cryogenic probe station

    The system provides He close-cycle cooling environments for electrical measurements.

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    Atomic Layer Deposition

    The system is adopted to develop new dielectrics materials